|
|
| Author |
Message |
daqmaster
Site Admin
Joined: 27 Jun 2005
Posts: 385
|
 Posted: Fri Nov 23, 2007 1:21 pm Post subject: Optimizing throughput of data acquisition and test systems |
 |
|
Learn to speed up test programs with the following tutorials...
Topics include:
- Understanding the Autozero Function: This tutorial applies to the 34401A, 34970A, and 34980A products.
- Adjusting NPLC and Aperture to perform high-speed measurements: To a great extent, a multimeter's reading speed is determined by the amt of time needed by the A/D converter.
- Perform High-Speed Measurements via Triggering
- Making high speed measurements when downloading waveforms: Waveforms are often used in test programs to simulate a sensor input to a device under test. Creating unique waveforms for an application can be done quickly through a number of sources including the 34980A’s DAC module.
Shown below: 34980A’s DAC in a test rack
More details here. |
|
| Back to top |
|
 |
|
|
You cannot post new topics in this forum
You cannot reply to topics in this forum
You cannot edit your posts in this forum
You cannot delete your posts in this forum
You cannot vote in polls in this forum
|
|
